Membres
UCL – IMCN / SUrface Characterisation (SUCH)

TVA 419.052.272
Acteur R&D

Monsieur Poleunis Claude
Responsable

Description

This technology platform has been created to gather the techniques used for characterising the surface of materials and bio-materials.
– XPS-ESCA and ToF-SIMS constitute the nucleus of this platform.
– X-ray photoelectron spectroscopy (XPS-ESCA)
– Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

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