Membres
UCL – IMCN / SUrface Characterisation (SUCH)
1348 Louvain-la-Neuve
Belgique
TVA 419.052.272
Acteur R&D
Monsieur Poleunis Claude
Responsable
Description
This technology platform has been created to gather the techniques used for characterising the surface of materials and bio-materials.
– XPS-ESCA and ToF-SIMS constitute the nucleus of this platform.
– X-ray photoelectron spectroscopy (XPS-ESCA)
– Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
